WAT6600 Wafer Acceptance Test
Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.
The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism
- Company：Semi Next 本社、三重事業所
- Price：Other
